Full scan testing of handshake circuits
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چکیده
applied science division of NWO and the technology programme of the Ministry of Economic Affairs in the Netherlands. No part of this work may be reproduced by print, photocopy or any other means without the permission in writing from the publisher. Dit proefschrift is goedgekeurd door de promotoren
منابع مشابه
Synchronous Full-Scan for Asynchronous Handshake Circuits
Handshake circuits form a special class of asynchronous circuits that has enabled the industrial exploitation of the asynchronous potential such as low power, low electromagnetic emission, and increased cryptographic security. In this paper we present a test solution for handshake circuits that brings synchronous test-quality to asynchronous circuits. We add a synchronous mode of operation to h...
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Due to the difficulty of test pattern generation for sequential circuits, several design-for-testability (DFT) approaches have been proposed. An improvement to these current approaches is needed to cater to the requirements of today’s more complicated chips. This paper introduces a new DFT method applicable to high-level description of circuits, which optimally utilizes existing functional elem...
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تاریخ انتشار 2003